for high-precision non-contact 3D metrology
Overview of features and benefits
- Wide range of materials: metal, plastics, polymers, glass, metal coatings, silicone, adhesives; reflective, transparent, semi-transparent, specular, nonspecular
- Wide range of objects and surfaces: objects can be small (several microns wide) to large (no upper limit), stationary or moving, solid or liquid, and include interiors of bores and tubes, exteriors of cylinders, concave or convex spherical shapes, extremely hot or cold, radioactive
- Versatility of setup: Non-contact probes work up to 1 m away from surface and more than 1 km from interferometer
- Small-diameter probes reach in to measure insides of bores and small-diameter tubes
- High-aspect-ratio surface features can be acquired: channels, grooves, steps, sharp edges, and more
- Continuous, long profile scanning: no area stitching required
- Option of multiplexing probes with single interferometer for additional ROI
- Easy integration of fiber probes in labs and in process: on XY tables, on multi-axes scanning mechanisms, inside machining centers, above moving webs, etc.
- Rugged probes: inspection possible in hostile environments where humans cannot work
- USB connection for data transfer from interferometer to PC or laptop
- Thickness: single-layer or multilayer films, coatings
- Surface roughness: surface characterization, flatness, and more
- Volume loss: component wear or other damage
- High-aspect-ratio features: steps, holes, grooves, channels
- Hard-to-reach spaces: interiors of bores, small aperture tubes, etc.
- Profilometry in hostile environments: radioactive, cryogenic, very hot
- Long stroke profiles
- Thickness of non-transparent materials
3D metrology and imaging for industry and R&D
- Quality control
- Online 3D production inspection, GD&T
- Statistical process control SPC
Novacam high-performance data acquisition software is included with all Microcam non-contact profilometers.
- PC, Windows®-based
- User-friendly interface for scan control on any Novacam inspection station (see Accessories tab)
The Application Programming Interface (API) is available for system integrators and OEMs. With the API, a wide variety online and offline applications can be accommodated.
Data analysis and 3D imaging
Data analysis and 3D imaging may take place offline or in real time.
- Data output formats: point cloud, 32 bit tiff
- Output exportable to:
- CAD/CAM software: PolyWorks, Geomagic, SolidWorks, Creo Elements/Pro (Pro/ENGINEER), etc.
- Imaging, visualization and numerical analysis software: ImageJ, Octave, MatLab, Mathematica, IDL, IGOR Pro
- Surface and roughness analysis software
- STL file format
Fiber-based optical probes
- Standard probes: 18 mm diameter, forward-looking or side-looking (90º)
- Standard small-diameter probes: choice of 1.05, 2.4, 3.05 or 4.6-mm diameter, front-looking or side-looking (90º)
Novacam designs and builds custom probes as needed. These can be:
- Extra-small, with diameters as small as 0.5 mm
- Extra-long to reach into hard-to-reach spaces
- Combined with galvanometers for efficient area or strip scanning
- Extra rugged for high temperatures and extreme environments
Lab inspection stations
For lab and QA applications:
- Inspection stations with probe displacement in 2, 3 or 4 axes
- Granite tables optionally available and recommended for some applications
Probes may be integrated with 3rd party CMMs (coordinate-measuring machines), CNC (computer numerical control) machines, or any robots.
Novacam designs and builds custom benchtop fixtures as needed.
Inline probe fixtures
Web scanning can be accomplished
- with a single scanning probe moving across the web or
- with multiple stationary probes which are multiplexed by an optical switch.
Novacam designs and builds custom inline fixtures as needed.
Optical switches for use with multiple probes
Optical switches are available for multiplexing up to 8 probes to a single interferometer.
The inspection capabilities of the profilometer are determined jointly by its two main components: the Microcam interferometer (signal processing detector) and the fiber-based optical probe selected for the application.
Microcam interferometer models
|Light wavelength||1310 nm, infrared|
|Interferometer enclosure||4U rackable enclosure|
445 (W) x 445 (D) x 178 (H) mm
|Depth of field||depends on selected probe parameters, |
see "Parameter selection for standard probes" table below
|Scanning depth range options*||3.5 mm||7 mm||5 mm|
|Acquisition (A-scan) rate||2.10 kHz||1.05 kHz||100 kHz|
|Axial (Z-axis) resolution||Less than 0.5 µm|
|Light spot size |
(Lateral [XY-axis] resolution)
|4.1 - 146 µm, depends on selected probe parameters, |
see "Parameter selection for standard probes" table below
|Standoff distance||1 - 100 mm for standard probes|
up to 1 m for non-standard probes
|Repeatability||Less than 1 µm|
|Thickness measurement range |
(in Air, IR = 1.0)
|10 µm - 3.5 mm||10 µm - 7 mm||20 µm - 5 mm|
|Typical materials for |
|glass, polymers, multi-layer films, coatings, plastics, silicone, liquids, specular or non-specular|
|Sample reflectivity||0.1 - 100%|
|*To further increase maximum scanning depth, a mechanical displacement axis is available.|
|Parameter selection for standard probes|
|Focal length (mm)|
|Aperture (mm)||1 mm||Light spot size (µm)||24.7||37.0||58.4||97.4||146.0|
|Depth of field (µm)||739||1654||4124||11455||25773|
|2.4 mm||Light spot size (µm)||8.8||13.1||20.7||34.5||51.7|
|Depth of field (µm)||93||207||517||1437||3233|
|4 mm||Light spot size (µm)||6.4||9.5||15.0||25.1||37.6|
|Depth of field (µm)||49||110||274||760||1710|
|7.6 mm||Light spot size (µm)||-||4.1||6.5||10.9||16.3|
|Depth of field (µm)||-||21||52||143||322|
|This table shows the relationship of light spot size (lateral resolution), focal length, depth of field, and probe aperture. Depth of field is the distance on either side of the focal plane where light spot size is √2 (approx 1.42) bigger than the spot size in focus.|