µCam-3D fiber based profilometer 


µCam-3D detector with x-y scanning table and probes

µCam-3D is enabling micron precision, optical non-contact, high speed surface profiling detector, which can measure roughness, film thickness and obtain cross sectional measurements. It is based on low coherent interferometry.

µCam-3D is used for :

• Mapping inside small diameter tube
• Non-destructive testing
• Surface inspection and roughness measurements
• Small diameter hole depth measurement
• Cross section imaging 

 

Industry specific applications

• Optical industry: Etching and deposition measurements for waveguides
• Inspection of optical components
• Forensic applications : bullet shape, cartridge, gun barrel inspection
• Glass industries thickness measurements
• Plastic industry: rheometry measurements
• Fuel cell metrology

Key Benefits

• Small fiber based probe
• High resolution
• Inhospitable environment
• Insensitive to the environment lighting
• Possible large standoff distance from the probe
• Measurements possible far from detector enclosure
• Advantage over triangulation sensors – does not need the angle between sensor and light projection

µCam-3D Specifications

light source SLD (super-luminescent diode)
wavelength 1310 nm
acquisition rate 1000 points / sec
depth range scanned   < 8mm
standoff distance from few mm up to 1meter
axial resolution <0.2μm
lateral resolution:  8-75 μm (depending on the probe used)
distance of the probe from the detector enclosure  <1km
  For additional informations or if you would like to receive our brochures, please contact us.


NOVACAM TECHNOLOGIES
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