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Non-transparent material thickness

Laser-Induced Breakdown Spectroscopy (LIBS)

A low-coherence profilometer can calculate the volume loss of a crater produced by a LIBS laser

A low-coherence profilometer can calculate the volume loss of a crater produced by a LIBS laser

Low-coherence profilometers can measure the thickness of non-transparent coatings when combined with laser-induced breakdown spectroscopy (LIBS) technology.

A Laser-Induced Breakdown Spectroscopy LIBS device pulses a powerful laser beam focused on a sample which vaporizes some material, then it performs spectral analysis on the resulting plasma. A low-coherence profilometer can measure the depth to which material has been removed. Since the light sources used for both techniques are in the same range, customized devices have been constructed using a common light path configuration. These devices are ideal for measuring non-transparent coating thickness.