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LIBS and Profilometry

Low-coherence profilometers are useful for measuring the thickness of non-transparent coatings when combined with laser-induced breakdown spectroscopy (LIBS) technology (Figure 1). A LIBS device pulses a powerful laser beam focused on a sample which vaporizes some material, then it performs spectral analysis on the resulting plasma. Low-coherence profilometry can measure the depth to which material has been removed. Since the light sources used for both techniques are in the same range, customized devices have been constructed using a common light path configuration. These devices are ideal for measuring coating thickness.

• For more details related to optical profilometry measurements combined with LIBS, see application note Volume Loss Measurement [PDF, 0.5 MB] or contact us.
• For our products, see Novacam’s profilometers.

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