Low coherence profilometers deliver non-contact thickness measurements and cross-section imaging of translucent coatings or films from 10 µm to several millimeters thick with a precision better than 1 µm. Whether the scanned films are single layer or multilayer, thickness measurements are obtained simultaneously and at high speed on all individual substrate layers.
Novacam's low coherence profilometers measure coating or film thickness in numerous high technology domains. Application fields include:
Figure 1: Cross-section of 6" diameter electronic wafer with unevenly applied thick film (≈250 µm thick ≈400 µm optical thickness) of photoresist coating. X:Y aspect ratio is 10:1
Unlike traditional microscope-like instruments, Novacam's profilometers obtain measurements via fiber-based probes deployable at a distance from the profilometer enclosure, without signal degradation. These probes allow for:
Providing additional ROI, several probes can be multiplexed to a single profilometer for simultaneous thickness measurements on different aspects of a production line. For instance, a multiplexed probe configuration is useful for quality inspection at the exit of a high-grade plastic catheter tube extruder. As it is being extruded, the small-aperture catheter tube (a multi-layer semi-translucent object) is scanned from two angles by two probes positioned at 90° to each. The scanned thickness data permits the application software to construct an optical cross-section image (Figure 2) and to calculate the inside and outside radii and wall thicknesses of the catheter tube, all in real-time.
Figure 2: Optical cross-section of a high grade polymer catheter tube, 1mm diameter
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